Fig. 5
SEM pictures of the DB interface of a reference sample (left) and a 5 μm Ni interlayer sample (right) showing the result of surface roughness induced by the surface machining in cross section and partial DB on the matching interface
SEM pictures of the DB interface of a reference sample (left) and a 5 μm Ni interlayer sample (right) showing the result of surface roughness induced by the surface machining in cross section and partial DB on the matching interface
