We demonstrated the direct visualization of molecularly thin lubricant films on magnetic disks with a thickness resolution of 0.1 nm by using an ellipsometric microscope with a white light source. It was able to reduce the optical interference noise that arises in conventional laser-based ellipsometric microscopes and to provide a larger SNR by a factor of about 6 compared to a laser-based ellipsometric microscope. The wavelength width should be given first priority in designing a white-light-source ellipsometric microscope, and the width should be determined after considering the required coherence length and thickness resolution. Theoretical calculations indicate that a wavelength width of less than 10 nm can provide a thickness resolution of 0.1 nm. A white-light-source ellipsometric microscope can provide real-time visualization of a molecularly thin lubricant film with a thickness resolution of 0.1 nm, which is useful in investigating the kinetic behavior of molecularly thin lubricant films on magnetic disks.

1.
Mate
,
M. C.
,
Toney
,
M. F.
, and
Leach
,
K. A.
,
2001
, “
Roughness of Thin Perfluoropolyether Lubricant Films: Influence on Disk Drive Technology
,”
IEEE Trans. Magn.
,
37
, pp.
1821
1823
.
2.
Azzam, R. M. A., and Bashara, N. M., 1986, Ellipsometry and Polarized Light. Amsterdam, North-Holland, Amsterdam, pp. 153–268.
3.
Novotny
,
V. J.
,
Hussad
,
I.
,
Turlet
,
J.-M.
, and
Philpott
,
M. R.
,
1989
, “
Liquid Polymer Conformation on Solid Surfaces
,”
J. Chem. Phys.
,
90
, pp.
5861
5868
.
4.
Toney
,
M. F.
,
Mate
,
C. M.
,
Leach
,
K. A.
, and
Pocker
,
D.
,
2000
, “
Thickness Measurements of Thin Perfluoropolyether Polymer Films on Silicon and Amorphous-Hydrogenated Carbon with X-Ray Reflectivity, ESCA and Optical Ellipsometry
,”
J. Colloid Interface Sci.
,
225
, pp.
219
226
.
5.
Meeks
,
S. W.
,
Weresin
,
W. E.
, and
Rosen
,
H. J.
,
1995
, “
Optical Surface Analysis of the Head-Disk-Interface of Thin Film Disks
,”
ASME J. Tribol.
,
117
, pp.
112
118
.
6.
Beaglehole
,
D.
,
1988
, “
Performance of a Microscopic Imaging Ellipsometer
,”
Rev. Sci. Instrum.
,
59
, pp.
2557
2559
.
7.
Hennon
,,
S.
and
Meunier
,
J.
,
1991
, “
Microscope at the Brewster Angle: Direct Observation of First-Order Phase Transitions in Monolayers
,”
Rev. Sci. Instrum.
,
62
, pp.
936
939
.
8.
Jin
,
G.
,
Jansson
,,
R.
and
Arwin
,
H.
,
1996
, “
Imaging Ellipsometry Revised: Development for Visualization of Thin Transparent Layers on Silicon Substrates
,”
Rev. Sci. Instrum.
,
67
, pp.
2930
2636
.
9.
Fukuzawa
,
K.
,
Noda
,
T.
, and
Mitsuya
,
Y.
,
2003
, “
Direct Visualization of Molecularly Thin Lubricant Films on Magnetic Disks With a Digitally Enhanced Ellipsometric Microscope
,”
IEEE Trans. Magn.
,
39
, pp.
898
902
.
10.
Jenkins, F. A., and White, H. E., 1981, Fundamentals of Optics, McGraw-Hill, New York, pp. 650–652.
11.
Jenkins, F. A., and White, H. E., 1981, Fundamentals of Optics, McGraw-Hill, New York, pp. 482–485.
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