Pin-on-disk wear tests on thin-film magnetic disks were performed using transparent materials. Quartz glass (QG), transparent zirconia (TZ), sapphire (SA), and synthesized diamond (DI) were used as pin materials. In addition to friction, sliding condition and pin wear were continuously monitored with video camera. Simultaneous friction measurement and video monitoring showed that friction dropped when wear debris intruded between pin and disk surfaces. Pin wear, from the measured diameter of wear scar on spherical pins, increased in the order of DI, SA, QG, and TZ. This order of pin wear does not coincide with that of the pin bulk hardness. Disk lifetime increased in the order of TZ, QG, SA, and DI, and the smaller the pin wear, the longer the disk lifetime.
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April 1995
Research Papers
Transparent Pin Wear Test on Thin-Film Magnetic Disk
Youichi Kawakubo,
Youichi Kawakubo
Mechanical Engineering Research Laboratory, Hitachi, Ltd., Tsuchiura, Ibaraki, 300 Japan
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Yotsuo Yahisa
Yotsuo Yahisa
Data Storage and Retrieval Systems Division, Hitachi, Ltd., Odawara, Kanagawa, 256 Japan
Search for other works by this author on:
Youichi Kawakubo
Mechanical Engineering Research Laboratory, Hitachi, Ltd., Tsuchiura, Ibaraki, 300 Japan
Yotsuo Yahisa
Data Storage and Retrieval Systems Division, Hitachi, Ltd., Odawara, Kanagawa, 256 Japan
J. Tribol. Apr 1995, 117(2): 297-301 (5 pages)
Published Online: April 1, 1995
Article history
Received:
February 21, 1994
Revised:
July 11, 1994
Online:
January 24, 2008
Citation
Kawakubo, Y., and Yahisa, Y. (April 1, 1995). "Transparent Pin Wear Test on Thin-Film Magnetic Disk." ASME. J. Tribol. April 1995; 117(2): 297–301. https://doi.org/10.1115/1.2831246
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