The reliability function of a component cannot be satisfactorily estimated from experiments, because: (i) an accurate estimation of the lifetime distribution tails, controlling the most important domain of high reliability, requires a very large sample and (ii) reliability tests under normal operational conditions are necessarily very lengthy. Hence the urgent need for a physical model for component lifetime statistics. The paper presents an application of the recently developed model for damage accumulation in polymeric materials to the long-term constant stress rupture experiments on Kevlar Composite, which is widely used in fiber optics. The strong dependence of the experimentally observed distribution shape on the load applied to a component has been previously explained in the framework of two different damage mechanisms: kinetic crack growth and chemical deterioration; the resultant 3-parameter lifetime distribution was predicted to be essentially non-Weibull. The proposed model, based on a single micro-mechanical damage mechanism, leads to a 2-parameter Weibull lifetime distribution with the shape parameter depending on the applied load by a simple inverse power law. Both distribution models were fitted to experimental lifetime data for different stress levels and the corresponding goodness of fit was compared by the usual likelihood ratio test. The proposed model describes the experimental data better — especially in the most important domain of low stress and long (of the order of years) lifetime. The model is physically sound and permits improved design of the accelerated tests and more accurate interpretation of their results, and finally quantitative prediction of the reliability function of the loaded polymeric component.
Statistical Aspects of Lifetime in the Presence of UV Radiation
Contributed by the Electronic and Photonic Packaging Division and presented at Poly 2000, London, United Kingdom, December 4-5, 2000. Manuscript received at ASME Headquarters, May 2002. Guest Editor: Bernd Michel.
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Zeifman, M. I., and Ingman, D. (March 14, 2003). "Statistical Aspects of Lifetime in the Presence of UV Radiation ." ASME. J. Electron. Packag. March 2003; 125(1): 1–3. https://doi.org/10.1115/1.1498263
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