In this paper, a methodology, and a program based on the methodology, are presented, which, using the reliability of solder joints for various values of design/process parameters, can be estimated in seconds on a personal computer. The proposed methodology accurately captures the behavior of a solder joint in an artificial neural network (ANN) model trained to relate design as well as analysis parameters to fatigue life. The proposed methodology is novel since such simultaneous analysis and design (SAND) procedures do not appear to have been employed until now for reliability estimation of solder joints. The use of Moire´ interferometry as an experimental technique to estimate the analysis-related inputs to the neutral network model is also presented in the paper. [S1043-7398(00)01101-4]
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e-mail: ganesh@colorado.edu
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March 2000
Technical Papers
A System for First Order Reliability Estimation of Solder Joints in Area Array Packages
Anand M. Deshpande,
Anand M. Deshpande
Department of Mechanical Engineering, University of Colorado at Boulder, Boulder, CO 80309-0427
11
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Ganesh Subbarayan,
e-mail: ganesh@colorado.edu
Ganesh Subbarayan
Department of Mechanical Engineering, University of Colorado at Boulder, Boulder, CO 80309-0427
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Dan Rose
Dan Rose
Storage Technology Corporation, Louisville, CO 80028-9152
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Anand M. Deshpande
11
Department of Mechanical Engineering, University of Colorado at Boulder, Boulder, CO 80309-0427
Ganesh Subbarayan
Department of Mechanical Engineering, University of Colorado at Boulder, Boulder, CO 80309-0427
e-mail: ganesh@colorado.edu
Dan Rose
Storage Technology Corporation, Louisville, CO 80028-9152
Contributed by the Electrical and Electronic Packaging Division for publication in the JOURNAL OF ELECTRONIC PACKAGING. Manuscript received by the EEPD July 29, 1998; revision received December 9, 1999. Associate Technical Editor: Y. Joshi.
J. Electron. Packag. Mar 2000, 122(1): 6-12 (7 pages)
Published Online: December 9, 1999
Article history
Received:
July 29, 1998
Revised:
December 9, 1999
Citation
Deshpande, A. M., Subbarayan, G., and Rose, D. (December 9, 1999). "A System for First Order Reliability Estimation of Solder Joints in Area Array Packages ." ASME. J. Electron. Packag. March 2000; 122(1): 6–12. https://doi.org/10.1115/1.483125
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