Digital microfluidic systems (DMSs) are emerging with high potential to serve as true labs-on-a-chip (LOCs) systems for various chemical and biochemical analyses. Significant research efforts have been devoted toward the design and fabrication of improved LOC systems. Due to design, fabrication, and also runtime uncertainties, feedback control schemes must be incorporated to ensure reliability and accuracy of LOCs for practical use. This paper introduces the basics of the control analysis and design of the DMS, which is a relatively unexplored area in digital microfluidics. Based on the semi-empirical models of the droplet dynamic system, simulation results of the closed-loop position control of a droplet between two adjacent cells of a DMS are presented. The dynamic response is analyzed and discussed in relation to the operational parameters of a DMS.
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e-mail: biddut@interchange.ubc.ca
e-mail: homayoun.najjaran@ubc.ca
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January 2010
Technical Briefs
Simulation of Droplet Position Control in Digital Microfluidic Systems
Biddut Bhattacharjee,
Biddut Bhattacharjee
School of Engineering,
e-mail: biddut@interchange.ubc.ca
University of British Columbia Okanagan
, Kelowna, BC, V1V 1V7, Canada
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Homayoun Najjaran
Homayoun Najjaran
School of Engineering,
e-mail: homayoun.najjaran@ubc.ca
University of British Columbia Okanagan
, Kelowna, BC, V1V 1V7, Canada
Search for other works by this author on:
Biddut Bhattacharjee
School of Engineering,
University of British Columbia Okanagan
, Kelowna, BC, V1V 1V7, Canadae-mail: biddut@interchange.ubc.ca
Homayoun Najjaran
School of Engineering,
University of British Columbia Okanagan
, Kelowna, BC, V1V 1V7, Canadae-mail: homayoun.najjaran@ubc.ca
J. Dyn. Sys., Meas., Control. Jan 2010, 132(1): 014501 (3 pages)
Published Online: December 1, 2009
Article history
Received:
July 11, 2008
Revised:
May 28, 2009
Online:
December 1, 2009
Published:
December 1, 2009
Citation
Bhattacharjee, B., and Najjaran, H. (December 1, 2009). "Simulation of Droplet Position Control in Digital Microfluidic Systems." ASME. J. Dyn. Sys., Meas., Control. January 2010; 132(1): 014501. https://doi.org/10.1115/1.4000077
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