The procedures of estimating the time to failure from accelerated test data are reviewed in this study. An accelerated life test approach which provides the desired reliability results for a fiber optic sensor in shorter times than would be possible with a test performed under normal stress conditions is presented. Utilizing ReliaSoft ALTA software the statistical and life distribution that describe the time to failure of the sensor is determined and the desired reliability results are calculated using the level probability density function.
- Electronic and Photonic Packaging Division
Accelerated Reliability Methodologies for Electronic Components: A Case Study
- Views Icon Views
- Share Icon Share
- Search Site
Strifas, N, Fraysse, J, & Ruzzene, M. "Accelerated Reliability Methodologies for Electronic Components: A Case Study." Proceedings of the ASME 2002 International Mechanical Engineering Congress and Exposition. Electronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology. New Orleans, Louisiana, USA. November 17–22, 2002. pp. 499-503. ASME. https://doi.org/10.1115/IMECE2002-39637
Download citation file: