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Technical Brief

A sensitivity analysis for ray-tracing simulations of concentrating solar collectors

[+] Author and Article Information
Julian D. Hertel

Department of Physics, Universitat de les Illes Balears, Ctra. de Valldemossa km 7.5, 07122 Palma de Mallorca, Illes Balears, Spain
julian.hertel@uib.es

Francesc Bonnín-Ripoll

Department of Physics, Universitat de les Illes Balears, Ctra. de Valldemossa km 7.5, 07122 Palma de Mallorca, Illes Balears, Spain
f.bonnin@uib.cat

Víctor Martínez

Department of Physics, Universitat de les Illes Balears, Ctra. de Valldemossa km 7.5, 07122 Palma de Mallorca, Illes Balears, Spain
victor.martinez@uib.es

Ramon Pujol

Department of Physics, Universitat de les Illes Balears, Ctra. de Valldemossa km 7.5, 07122 Palma de Mallorca, Illes Balears, Spain
ramon.pujol@uib.es

1Corresponding author.

ASME doi:10.1115/1.4039329 History: Received June 15, 2017; Revised January 19, 2018

Abstract

The set of optical models that is applied in ray-tracing software determines the accuracy of its output. A sensitivity analysis was carried out using a powerful in-house program, which provides a large number of surface reflectance and scattering models and in addition, can also run spectral simulations. A linear Fresnel collector was selected as a test case together with the most accurate data that can be found in the literature for the optical properties of its components. The test results indicate that simulations based on constant values, such as mostly provided by the manufacturer, are generally inaccurate and a spectral simulation is not essential for thermal applications.

Copyright (c) 2018 by ASME
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