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Research Papers

Prediction of the Potential Induced Degradation of Photovoltaic Modules Based on the Leakage Current Flowing Through Glass Laminated With Ethylene-Vinly Acetate

[+] Author and Article Information
Gi-Hwan Kang

Photovoltaic Laboratory,
Korea Institute of Energy Research (KIER),
152 Gajeong-ro, Yuseong-Gu,
Daejeon 305-343, South Korea
e-mail: ghkang@kier.re.kr

Han-Byul Kim

Dayou Smart Energy Company Limited,
136 Cheomdansaneop 1-ro,
Daesowon-myon, Chungju-si,
Chungbuk-do 380-871, South Korea
e-mail: hbkim@dayou.co.kr

Tae-Hee Jung

Photovoltaic Laboratory,
Korea Institute of Energy Research (KIER),
152 Gajeong-ro, Yuseong-Gu,
Daejeon 305-343, South Korea
e-mail: thjung@kier.re.kr

Young-chul Ju

Photovoltaic Laboratory,
Korea Institute of Energy Research (KIER),
152 Gajeong-ro, Yuseong-Gu,
Daejeon 305-343, South Korea
e-mail: ycju@kier.re.kr

Suk-Whan Ko

Photovoltaic Laboratory,
Korea Institute of Energy Research (KIER),
152 Gajeong-ro, Yuseong-Gu,
Daejeon 305-343, South Korea
e-mail: Korea19@kier.re.kr

Hee-eun Song

Photovoltaic Laboratory,
Korea Institute of Energy Research (KIER),
152 Gajeong-ro, Yuseong-Gu,
Daejeon 305-343, South Korea
e-mail: hsong@kier.re.kr

Contributed by the Solar Energy Division of ASME for publication in the JOURNAL OF SOLAR ENERGY ENGINEERING: INCLUDING WIND ENERGY AND BUILDING ENERGY CONSERVATION. Manuscript received August 19, 2014; final manuscript received February 10, 2015; published online March 17, 2015. Editor: Robert F. Boehm.

J. Sol. Energy Eng 137(4), 041001 (Aug 01, 2015) (6 pages) Paper No: SOL-14-1240; doi: 10.1115/1.4029933 History: Received August 19, 2014; Revised February 10, 2015; Online March 17, 2015

In the potential induced degradation (PID) phenomenon, the output power of a photovoltaic (PV) module decreases due to the high potential difference between the PV system and the ground. This voltage forcefully moves the positive charge in the module to the surface of the solar cell. The accumulated charge leads to the performance deterioration of the module, namely, PID of the module. We conducted a study to accurately predict the output reduction of the module operating in various installation conditions coming from the PID phenomenon. We investigated the leakage current flowing through front glass laminated with encapsulation material simultaneously exposed to various performance conditions of the PV system, namely, relative humidity, temperature, and applied voltage, which have an important effect on the PID of the module. The degradation of the module coming from PID was calculated on the basis of the obtained leakage current. To confirm the calculated data, modules with one solar cell were manufactured and the power loss results of the modules' exposure to various PID generation experiments were compared with the expected results. The results showed that we could predict the degradation of the modules by PID within a 2% tolerance under the PV system installation conditions.

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Copyright © 2015 by ASME
Topics: Temperature , Glass , Leakage
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References

Ndiaye, A., Charki, A., Kobi, A., Kebe, C. M. F., Ndiaye, P. A., and Sambou, V., 2013, “Degradations of Silicon Photovoltaic Modules: A Literature Review,” Sol. Energy, 96(10), pp. 140–151. [CrossRef]
Kang, G. H., Yu, G. J., Ahn, H. K., and Han, D. Y., 2004, “Consideration of Electrical Properties in Field-Aged Photovoltaic Module,” J. Korean Inst. Electr. Electron. Mater. Eng. (KIEEME), 17(12), pp. 1289–1295.
Polverini, D., Field, M., Dunlop, E., and Zaaiman, W., 2013, “Polycrystalline Silicon PV Modules Performance and Degradation Over 20 Years,” Prog. Photovoltaics Res. Appl., 21(5), pp. 1004–1015. [CrossRef]
Schmid, J., Drapalik, M., Kancsar, E., Schlosser, V., and Klinger, G., 2011, “A Study of Power Quality Loss in PV Modules Caused by Wind Induced Vibration Located in Vienna,” Sol. Energy, 85(7), pp. 1530–1536. [CrossRef]
Ye, Z., Nobre, A., Reindl, T., Luther, J., and Reise, C., 2013, “On PV Module Temperatures in Tropical Regions,” Sol. Energy, 88(2), pp. 80–87. [CrossRef]
Hacke, P., Kempe, M., Terwilliger, K., Glick, S., Call, N., Johnston, S., and Kurtz, S., 2010, “Characterization of Multicrystalline Silicon Modules With System Bias Voltage Applied in Damp Heat,” Proceedings of 25th EUPVSEC, Valencia, Spain, pp. 3760–3765.
Hacke, P., Terwilliger, K., Smith, R., Glick, S., Pankow, J., Kempe, M., and Kurtz, S., 2011, “System Voltage Potential-Induced Degradation Mechanisms in PV Modules and Methods for Test,” Proceedings of 37th IEEE PVSC, Seattle, WA, pp. 814–820.
Swanson, R., Cudzinovic, M., DeCeuster, D., Desai, V., Jürgens, J., Kaminar, N., Mulligan, W., Barbarosa, L. R., Rose, D., Smith, D., Terao, A., and Wilson, K., 2005, “The Surface Polarization Effect in High-Efficiency Silicon Solar Cells,” Proceedings of 15th International Photovoltaic Science and Engineering Conference (PVSEC-15), Shanghai, China.
Koch, S., Nieschalk, D., Berghold, J., Wendlandt, S., Krauter, S., and Grunow, P., 2012, “Potential Induced Degradation Effects on Crystalline Silicon Cells With Various Antireflective Coatings,” Proceedings of 27th EUPVSEC, Frankfurt, Germany, pp. 1985–1990.
Pingel, S., Frank, O., Winkler, M., Daryan, S., Geipel, T., Hoehne, H., and Berghold, J., 2010, “Potential-Induced Degradation of Solar Cells and Panels,” The IEEE Photovoltaic Specialists Conference, Honolulu, HI, pp. 2817–2822. [CrossRef]
Naumann, V., Lausch, D., Hähnel, A., Bauer, J., Breitenstein, T., Graff, A., Werner, M., Swatek, S., Großer, S., Bagdahn, J., and Hagendorf, C., 2014, “Explanation of Potential-Induced Degradation of the Shunting Type by Na Decoration of Stacking Faults in Si solar cells,” Sol. Energy Mater. Sol. Cells, 120(11), pp. 383–389. [CrossRef]
Bauer, J., Naumann, V., Großer, S., Hagendorf, C., Schütze, M., and Breitenstein, O., 2012, “On the Mechanism of Potential-Induced Degradation in Crystalline Silicon Solar Cells,” Phys. Status Solidi RRL, 6(8), pp. 331–333. [CrossRef]
Lechner, P., Sanchez, D., Geyer, D., and Mohring, H. D., 2012, “Estimation of Time to PID-Failure by Characterisation of Module Leakage Currents,” Proceedings of 27th European Photovoltaic Solar Energy Conference and Exhibition, pp. 3152–3156.
Hoffmann, S., and Koehl, M., 2012, “Influence of Humidity and Temperature on the Potential Induced Degradation,” Proceedings of 27th European Photovoltaic Solar Energy Conference and Exhibition, pp. 3148–3151.
Koch, S., Berghold, J., Okoroafor, O., Krauter, S., and Grunow, P., 2012, “Encapsulation Influence on the Potential Induced Degradation of Crystalline Silicon Cells With Selective Emitter Structures,” Proceedings of 27th European Photovoltaic Solar Energy Conference and Exhibition, pp. 1991–1995.
Singh, P., Singh, S. N., Lal, M., and Husain, M., 2008, “Temperature Dependence of I–V Characteristics and Performance Parameters of Silicon Solar Cell,” Sol. Energy Mater. Sol. Cells, 92(12), pp. 1611–1616. [CrossRef]
Tsai, D. M., Wu, S. C., and Li, W. C., 2012, “Defect Detection of Solar Cells in Electroluminescence Images Using Fourier Image Reconstruction,” Sol. Energy Mater. Sol. Cells, 99(4), pp. 250–262. [CrossRef]

Figures

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Fig. 1

The diagram of the experimental procedure

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Fig. 2

The schematic diagram of the leakage current measurement method of glass laminated with an EVA sheet

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Fig. 3

The resistance of EVA/Glass in three experimental conditions: (a) 250 V, (b) 500 V, and (c) 1000 V

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Fig. 4

The leakage current passing through Glass/EVA in the various experimental conditions: (a) 250 V, (b) 500 V, and (c) 1000 V

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Fig. 5

Illuminated current–voltage curves of mini modules after the PID generation experiment (85 °C, 85% RH, 1000 V)

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Fig. 6

The dark I–V curves of the mini modules after the PID generation experiment (85 °C, 85% RH, 1000 V)

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Fig. 7

EL images of the mini modules before and after the PID generation experiment (85 °C, 85% RH, 1000 V)

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Fig. 8

The average power loss ratio of the mini modules for each experimental condition in Table 4

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Fig. 9

The measured and predicted power loss ratio of modules coming from PID for equal time

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