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RESEARCH PAPERS

In-Situ FT-IR Monitoring of a Solar Flux Induced Chemical Process

[+] Author and Article Information
J. R. Markham, J. E. Cosgrove, C. M. Nelson

Advanced Fuel Research, Inc., 87 Church Street, East Hartford, CT 06108

A. S. Bonanno

On-Line Technologies, Inc., 87 Church Street, East Hartford, CT 06108

R. E. Schlief, M. A. Stoy

Solar Reactor Technologies, Inc., 3250 Mary Street, Suite 407, Miami, FL 33233

G. C. Glatzmaier, C. E. Bingham, A. A. Lewandowski

National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden, CO 80401

J. Sol. Energy Eng 119(3), 219-224 (Aug 01, 1997) (6 pages) doi:10.1115/1.2888022 History: Received July 01, 1996; Revised February 01, 1997; Online February 14, 2008

Abstract

The capability to perform in-situ, on-line monitoring of processes induced by concentrated solar flux will enhance the development and utilization of solar technologies. Temperature measurements and chemical concentration measurements provide an understanding of the ongoing chemistry, process limits, and process reproducibility. A Fourier transform infrared (FT-IR) spectrometer was optically coupled to a quartz flow reactor at the High Flux Solar Furnace of the National Renewable Energy Laboratory in Golden, CO. In-situ emission/transmission spectroscopy was utilized to simultaneously monitor steam temperature and the concentration of formed hydrogen bromide during the solar flux induced reaction of steam and bromine. The photochemical process is being investigated for the production of industrial quantities of hydrogen and oxygen, where downstream electrolysis of the formed hydrogen bromide provides the hydrogen and regenerates bromine. Steam temperature was measured to increase upon the addition of bromine to the reactor. Gas temperature increases of 200°C to 400°C were observed. Hydrogen bromide concentrations up to ten percent of the reactor gas volume were measured. The FT-IR system provided quantitative information of two critical parameters of the measured process and serves to accelerate this technology area.

Copyright © 1997 by The American Society of Mechanical Engineers
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